![thumbnail image](https://extension.entm.purdue.edu/newsletters/pestandcrop/wp-content/uploads/sites/2/2020/10/fig1.jpeg)
Even if grain yield monitor calibration, adjustments, and operation are faithfully conducted (Luck & Fulton, 2014; Nielsen, 2020c), the resulting yield data sets almost always require some post-harvest processing and “cleaning” procedures to rid the data set of anomalies and “gremlins” (Luck et al., 2015; Nielsen, 2020a; Nielsen, 2020b).